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74HC126DB

Quad buffer/line driver; 3-state

The 74HC126; 74HCT126 is a quad buffer/line driver with 3-state outputs controlled by the output enable inputs (nOE). A LOW on nOE causes the outputs to assume a high-impedance OFF-state. Inputs include clamp diodes. This enables the use of current limiting resistors to interface inputs to voltages in excess of VCC.

此产品已停产

Features and benefits

  • Wide supply voltage range from 2.0 V to 6.0 V

  • CMOS low power dissipation

  • High noise immunity

  • Latch-up performance exceeds 100 mA per JESD 78 Class II Level B

  • Complies with JEDEC standards:

    • JESD8C (2.7 V to 3.6 V)

    • JESD7A (2.0 V to 6.0 V)

  • Input levels:

    • For 74HC126: CMOS levels

    • For 74HCT126: TTL levels

  • ESD protection:
    • HBM: ANSI/ESDA/JEDEC JS-001 class 2 exceeds 2000 V

    • CDM: ANSI/ESDA/JEDEC JS-002 class C3 exceeds 1000 V

  • Specified from -40 °C to +85 °C and from -40 °C to +125 °C

参数类型

型号 Product status Package name
74HC126DB End of life SSOP14

PCB Symbol, Footprint and 3D Model

Model Name 描述

封装

下表中的所有产品型号均已停产 。

型号 可订购的器件编号,(订购码(12NC)) 状态 标示 封装 外形图 回流焊/波峰焊 包装
74HC126DB 74HC126DB,112
(935171430112)
Obsolete no package information
74HC126DB,118
(935171430118)
Obsolete

环境信息

下表中的所有产品型号均已停产 。

型号 可订购的器件编号 化学成分 RoHS RHF指示符
74HC126DB 74HC126DB,112 74HC126DB rohs rhf rhf
74HC126DB 74HC126DB,118 74HC126DB rohs rhf rhf
品质及可靠性免责声明

文档 (3)

文件名称 标题 类型 日期
74HC_HCT126 Quad buffer/line driver; 3-state Data sheet 2024-02-29
AN11044 Pin FMEA 74HC/74HCT family Application note 2019-01-09
HCT_USER_GUIDE HC/T User Guide User manual 1997-10-31

支持

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模型

No documents available

PCB Symbol, Footprint and 3D Model

Model Name 描述

How does it work?

The interactive datasheets are based on the Nexperia MOSFET precision electrothermal models. With our interactive datasheets you can simply specify your own conditions interactively. Start by changing the values of the conditions. You can do this by using the sliders in the condition fields. By dragging the sliders you will see how the MOSFET will perform at the new conditions set.