ESD Experts Webinar
Are you ready to dive into the latest trends in ESD protection? Join us for a webinar where leading experts will share cutting-edge insights on the most pressing challenges in Charged Device Model (CDM) ESD and AC-coupled high-speed interfaces. Each session will feature live Q&A, giving you the chance to engage directly with the presenters. The same webinar will be offered twice, please click on the link to see the schedule in your time zone.
Why attend?
- Learn about the latest CDM ESD challenges in modern semiconductor technology
- Gain in-depth knowledge of ESD protection for high-speed interfaces
- Engage with industry experts and ask questions during the live Q&A
Topic 1: Challenges in Charged Device Model (CDM) ESD
📢 Presented by Gabriel Fellner, PhD candidate in the research group of Prof. Dr. David Pommerenke at Graz University of Technology
Gabriel Fellner will explore the latest challenges in CDM ESD. With the continuous downscaling of semiconductor technology toward sub-10 nm and the increasing need for ultra-high-speed interface input/output (IO) systems, on-chip ESD protection faces new, stringent demands. This presentation will also cover the importance of discharge current characterization in mitigating risks.
Topic 2: Protection Scenarios for AC-Coupled High-Speed Interfaces
📢 Presented by Stefan Seider, Senior Product Manager, Nexperia
Stefan Seider will delve into AC-coupled interfaces, such as USB4 Tx/Rx, discussing the critical placement of ESD protection devices. He will highlight the impact of these placements on system-level ESD robustness and Vbus short-circuit scenarios, comparing high-voltage to low-voltage protection solutions.
Speakers
Gabriel Fellner
Gabriel Fellner received his MSc. degree in 2021 and is currently PhD candidate in the research group of Prof. Dr. David Pommerenke at Graz University of Technology. He is conducting research in system level and component level ESD with focus on CDM.
Stefan Seider
Stefan Seider is Senior Product Manager for protection and filtering devices at Nexperia. He works on ESD/EMI and RF signal integrity topics for product definition since 2007 and joined Philips Semiconductors/NXP/Nexperia in 2001.